基于TDC的無死區(qū)頻率測量技術研究
doi: 10.11999/JEIT200807
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1.
中國科學院國家授時中心 西安 710600
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2.
中國科學院時間頻率基準重點實驗室 西安 710600
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3.
西安電子科技大學 西安 710071
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4.
中國科學院大學 北京 100049
基金項目: 中國科學院戰(zhàn)略性先導科技專項(B類)(XDB21030200)，廣東省重點領域研發(fā)計劃項目(2018B030325001)
Research on Dead-time Free Frequency Measurement Technology Based on TDC
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1.
National Time Service Center, Chinese Academy of Sciences, Xi’an 710600, China
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2.
Key Laboratory of Time and Frequency Standards, Chinese Academy of Sciences, Xi’an 710600, China
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3.
Xidian University, Xi’an 710071, China
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4.
University of Chinese Academy of Sciences, Beijing 100049, China
Funds: The Strategic Priority Research Program of the Chinese Academy of Sciences (XDB21030200), The Research and Development Program in Key Areas of Guangdong Province (2018B030325001)
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摘要: 在精密時頻測控領域中，高分辨率、無死區(qū)的時間間隔和頻率測量非常關鍵，而時間數(shù)字轉換器(Time to Digital Converter, TDC)是時間頻率測量的常用手段。該文研制了基于ACAM公司生產的時間數(shù)字轉換芯片TDC-GP21和Altera公司FPGA芯片EP4CE6E22C8N的時間頻率測量設備，實現(xiàn)了高分辨率的時間間隔測量，測量分辨率達到13ps 。同時采用時間間隔測量模塊兩兩組合的方式實現(xiàn)了無死區(qū)頻率測量，創(chuàng)新性地采用每組3個TDC芯片，共4組搭建了時間頻率測量系統(tǒng)，并對組內3個TDC芯片測量結果采用平均值濾波法，使頻率測量穩(wěn)定度達到
$ 1.1 $ ×$ {10}^{-11} $ @1 s,$ 5.6\times {10}^{-15} $ @10000 s，與商用K+K FXE頻率計數(shù)器指標相當。本設備具有體積小、無需校準、成本低等優(yōu)點，能夠廣泛應用到高精度時間間隔和精密頻率測量領域中。-
關鍵詞:
- 頻率測量 /
- 時間間隔測量 /
- 時間數(shù)字轉換器(TDC) /
- 高精度 /
- 無死區(qū)
Abstract: In the fields requiring precise time and frequency measurement and control, high-precision, dead-time free time interval and frequency measurements are highly demanded. TDC (Time to Digital Converter) is commonly adopted in time and frequency measurement. In this paper, a self-developed multi-module time-interval measurement system is built based on the time digital conversion chip TDC-GP21 from ACAM company and the Cyclone IV FPGA chip EP4CE6E22C8N from Altera Company. For each time-interval measurement module, a time-interval measurement resolution as small as 13 ps is achieved. By further duplex operating two such time-interval measurement modules, a dead-time free frequency measurement is realized, the time and frequency measurement system involves three groups, each of which has 3 TDC chips. By averaging the measurement results of three TDC chips in each group, a frequency instability reaches$ 1.1\times {10}^{-11} $ @ 1s and$ 5.6\times {10}^{-15} $ @10000 s. This result shows that this self-developed apparatus approaches the performance of the commercial K+K FXE frequency counter. Due to its advantages of small size, no calibration and low cost, this apparatus can be widely used in applications that require high-precision time interval and precise frequency measurements. -
表 1 測量結果穩(wěn)定性對比表
頻率測量設備名稱 短期穩(wěn)定性 長期穩(wěn)定性 本文所設計的時頻測量設備 1.1e-11@1s 5.6e-15@10000s K+K FXE 2.3e-11@1s 3.8e-15@10000s 53230A 1.9e-11@1s 2.3e-13@10000s 
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