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基于縮短極化碼的MLC NAND Flash差錯(cuò)控制技術(shù)研究

郭銳 王美潔 王杰

郭銳, 王美潔, 王杰. 基于縮短極化碼的MLC NAND Flash差錯(cuò)控制技術(shù)研究[J]. 電子與信息學(xué)報(bào), 2017, 39(7): 1658-1665. doi: 10.11999/JEIT160864
引用本文: 郭銳, 王美潔, 王杰. 基于縮短極化碼的MLC NAND Flash差錯(cuò)控制技術(shù)研究[J]. 電子與信息學(xué)報(bào), 2017, 39(7): 1658-1665. doi: 10.11999/JEIT160864
GUO Rui, WANG Meijie, WANG Jie. Research on the MLC Nand Flash Error Control Technology Based on Polar Codes[J]. Journal of Electronics & Information Technology, 2017, 39(7): 1658-1665. doi: 10.11999/JEIT160864
Citation: GUO Rui, WANG Meijie, WANG Jie. Research on the MLC Nand Flash Error Control Technology Based on Polar Codes[J]. Journal of Electronics & Information Technology, 2017, 39(7): 1658-1665. doi: 10.11999/JEIT160864

基于縮短極化碼的MLC NAND Flash差錯(cuò)控制技術(shù)研究

doi: 10.11999/JEIT160864
基金項(xiàng)目: 

浙江省自然科學(xué)基金(LY16F010013),浙江省重點(diǎn)科技創(chuàng)新團(tuán)隊(duì)基金(2013TD03),國(guó)家自然科學(xué)基金(61401130)

Research on the MLC Nand Flash Error Control Technology Based on Polar Codes

Funds: 

The Natural Science Foundation of Zhejiang Province (LY16F010013), The Key Science and Technology Innovation Team Foundation of Zhejiang Province (2013TD03), The National Natural Science Foundation of China (61401130)

  • 摘要: 為了提高M(jìn)LC NAND Flash的抗誤碼性能,該文提出一種基于優(yōu)化縮短極化碼的MLC NAND Flash差錯(cuò)控制方法。優(yōu)化縮短極化碼通過優(yōu)化刪減圖樣得到,首先通過比特翻轉(zhuǎn)重排序的方式得到基本刪減圖樣,進(jìn)而選擇具有更低信道容量的凍結(jié)比特組成優(yōu)化刪減圖樣,使得到的刪減比特全為凍結(jié)比特,可以顯著提高刪減算法的糾錯(cuò)性能。同時(shí),根據(jù)MLC單元錯(cuò)誤的不對(duì)稱性,采用碼率自適應(yīng)的碼字對(duì)FLASH中MSB和LSB進(jìn)行不等錯(cuò)誤保護(hù)。仿真結(jié)果表明:當(dāng)誤幀率為10-3時(shí),優(yōu)化縮短極化碼較相同碼長(zhǎng)的LDPC碼和基本縮短極化碼分別約有 3.72 ~5.89 dB和1.47~3.49 dB增益;相比基于同一碼率的優(yōu)化縮短極化碼方案,不等錯(cuò)誤保護(hù)的差錯(cuò)控制方案獲得約0.25 dB增益。
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出版歷程
  • 收稿日期:  2016-08-22
  • 修回日期:  2017-01-12
  • 刊出日期:  2017-07-19

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