X波段脈沖空間行波管輸出結(jié)構(gòu)可靠性研究

尚新文; 李鑫偉; 曹林林; 肖劉; 蘇小保

doi:10.11999/JEIT160003

X波段脈沖空間行波管輸出結(jié)構(gòu)可靠性研究

doi: 10.11999/JEIT160003

基金項(xiàng)目:

國(guó)家科技重大專(zhuān)項(xiàng)(2012ZX01007004001)，國(guó)家自然科學(xué)基金(61401427)，中科院國(guó)防科技創(chuàng)新基金(CXJJ-16Q137)

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出版歷程
- 收稿日期: 2016-01-04
- 修回日期: 2016-04-14
- 刊出日期: 2016-10-19

Study of the Reliability of the Output Structure for X-band Space Traveling Wave Tube

Funds:

The National Science and Technology Major Project (2012ZX01007004001), The National Natural Science Foundation of China (61401427), The National Defense Science and Technology Innovation Foundation, Chinese Academy of Sciences, (CXJJ-16Q137)

摘要

摘要: X波段脈沖空間行波管主要用于輕型SAR等雷達(dá)系統(tǒng)，要求行波管具有高功率、高效率、高可靠的性能。輸出結(jié)構(gòu)是行波管的重要部件，其可靠性不僅影響行波管的輸出功率等性能，還影響行波管的穩(wěn)定性與可靠性。該文針對(duì)X脈沖空間行波管輸出結(jié)構(gòu)進(jìn)行可靠性研究，通過(guò)電、磁、熱多物理場(chǎng)耦合的方式對(duì)它進(jìn)行熱、力結(jié)構(gòu)可靠性分析，按分析結(jié)果對(duì)輸出結(jié)構(gòu)薄弱環(huán)節(jié)進(jìn)行改進(jìn)，耐沖擊能力增強(qiáng)，并經(jīng)過(guò)1000 h以上的整管老練及空間環(huán)境試驗(yàn)驗(yàn)證，輸出結(jié)構(gòu)具有較高的可靠性，滿(mǎn)足空間環(huán)境試驗(yàn)及使用要求。
- 脈沖空間行波管 /
- 多物理場(chǎng)耦合 /
- 輸出結(jié)構(gòu) /
- 可靠性
Abstract: X-band pulsed space Traveling Wave Tube (TWT) is mainly used in such radar system as light-weight SAR, which is required to have high power, high efficiency and high reliability. The output structure is an important part of the TWT, and its reliability not only affects the output power of TWT, but also influences the stability and reliability of the TWT. In this paper, the reliability of the output structure of an X-band pulsed space TWT is studied. The thermal and structural reliability is studied by means of multi-physics coupling including electrical and magnetic. The shock resistance ability of the output structure is improved according to the analysis results. Furthermore, in the course of above 1000 hours aging and space environmental test, the output structure has high reliability, meeting the space environment test and use requirements.
- Pulsed space Traveling Wave Tube (TWT) /
- Multi-physics coupling /
- Output structure /
- Reliability

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