基于四值脈沖參數(shù)模型的單粒子瞬態(tài)傳播機(jī)理與軟錯誤率分析方法

李悅; 蔡剛; 李天文; 楊海鋼

doi:10.11999/JEIT151254

基于四值脈沖參數(shù)模型的單粒子瞬態(tài)傳播機(jī)理與軟錯誤率分析方法

doi: 10.11999/JEIT151254

2.
(中國科學(xué)院電子學(xué)研究所北京 100190) ②(中國科學(xué)院大學(xué) 北京 100049)

基金項(xiàng)目:

國家自然科學(xué)基金(61271149)，國家科技重大專項(xiàng)資助(2013ZX03006004)

計(jì)量
- 文章訪問數(shù): 1241
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- 被引次數(shù): 0
出版歷程
- 收稿日期: 2015-11-09
- 修回日期: 2016-04-01
- 刊出日期: 2016-08-19

Propagation Mechanism of Single Event Transient and Soft Error Rate Analysis Method Based on Four-value Pulse Parameters Model

2.
(Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China)

Funds:

The National Natural Science Foundation of China (61271149), The National Science and Technology Major Special Fund (2013ZX03006004)

摘要

摘要: 隨著工藝尺寸的不斷縮小，由單粒子瞬態(tài)(Single Event Transient, SET)效應(yīng)引起的軟錯誤已經(jīng)成為影響宇航用深亞微米VLSI電路可靠性的主要威脅，而SET脈沖的產(chǎn)生和傳播也成為電路軟錯誤研究的熱點(diǎn)問題。通過研究SET脈沖在邏輯鏈路中的傳播發(fā)現(xiàn)：脈沖上升時間和下降時間的差異能夠引起輸出脈沖寬度的展寬或衰減；脈沖的寬度和幅度可決定其是否會被門的電氣效應(yīng)所屏蔽。該文提出一種四值脈沖參數(shù)模型可準(zhǔn)確模擬SET脈沖形狀，并采用結(jié)合查找表和經(jīng)驗(yàn)公式的方法來模擬SET脈沖在電路中的傳播過程。該文提出的四值脈沖參數(shù)模型可模擬SET脈沖在傳播過程中的展寬和衰減效應(yīng)，與單參數(shù)脈沖模型相比計(jì)算精度提高了2.4%。該文應(yīng)用基于圖的故障傳播概率算法模擬SET脈沖傳播過程中的邏輯屏蔽，可快速計(jì)算電路的軟錯誤率。對ISCAS89及ISCAS85電路進(jìn)行分析的實(shí)驗(yàn)結(jié)果表明：該方法與HSPICE仿真方法的平均偏差為4.12%，計(jì)算速度提升10000倍。該文方法可對大規(guī)模集成電路的軟錯誤率進(jìn)行快速分析。
- 超大規(guī)模集成電路 /
- 軟錯誤率 /
- 單粒子瞬態(tài) /
- 四值脈沖參數(shù) /
- 故障傳播概率
Abstract: With the shrinking of feature size, soft errors due to Single Event Transient (SET) effect become the main reliability threat for aerospace deep sub-micron VLSI circuits, and the generation and propagation of SET pulse is also a hot issue in the study of soft error. Results of SET pulse propagation on logic chains show that the difference of rise and fall time of SET pulse can make the width of output pulse widened or lessened. The width and amplitude of SET pulse can determine whether it is electrically masked out. A four-value pulse parameters model is proposed to accurately characterize the shape of SET pulse, and then the LUT-based technique is combined with experiential equations to model the transmission process of SET. The proposed four-value pulse parameters model can model the effect of broadening or attenuation of SET pulse, and it has calculation precision improvement of 2.4% compared with single parameter model. This paper applies the graph-based error propagation probability analytic algorithm to estimate the logical masking in pulse propagation. The experimental results on ISCAS89 and ISCAS85 circuits show that the average deviation of this method and HSPICE simulation method is 4.12% and the calculation speed is 10000 times. This method can be used to analyze quickly the soft error rate of large scale integrated circuits.
- Very Large Scale Integration (VLSI) /
- Soft error rate /
- Single Event Transient (SET) /
- Four-value pulse parameters /
- Error propagation probability

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