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基于65 nm工藝的多端口可配置PUF電路設(shè)計(jì)

李剛 汪鵬君 張躍軍 錢(qián)浩宇

李剛, 汪鵬君, 張躍軍, 錢(qián)浩宇. 基于65 nm工藝的多端口可配置PUF電路設(shè)計(jì)[J]. 電子與信息學(xué)報(bào), 2016, 38(6): 1541-1546. doi: 10.11999/JEIT150968
引用本文: 李剛, 汪鵬君, 張躍軍, 錢(qián)浩宇. 基于65 nm工藝的多端口可配置PUF電路設(shè)計(jì)[J]. 電子與信息學(xué)報(bào), 2016, 38(6): 1541-1546. doi: 10.11999/JEIT150968
LI Gang, WANG Pengjun, ZHANG Yuejun, QIAN Haoyu. Design of Multi-port Configurable PUF Circuit Based on 65 nm Technology[J]. Journal of Electronics & Information Technology, 2016, 38(6): 1541-1546. doi: 10.11999/JEIT150968
Citation: LI Gang, WANG Pengjun, ZHANG Yuejun, QIAN Haoyu. Design of Multi-port Configurable PUF Circuit Based on 65 nm Technology[J]. Journal of Electronics & Information Technology, 2016, 38(6): 1541-1546. doi: 10.11999/JEIT150968

基于65 nm工藝的多端口可配置PUF電路設(shè)計(jì)

doi: 10.11999/JEIT150968
基金項(xiàng)目: 

國(guó)家自然科學(xué)基金(61474068, 61274132),浙江省自然科學(xué)基金(LQ14F040001),浙江省教育廳項(xiàng)目(Y201430798)

Design of Multi-port Configurable PUF Circuit Based on 65 nm Technology

Funds: 

The National Natural Science Foundation of China (61474068, 61274132), The Natural Science Foundation of Zhejiang Provice (LQ14F040001), The Project of Department of Education of Zhejiang Provice (Y201430798)

  • 摘要: 物理不可克隆函數(shù)(Physical Unclonable Function, PUF)電路利用結(jié)構(gòu)完全相同的電路在制造過(guò)程中存在的隨機(jī)工藝偏差,產(chǎn)生具有唯一性、隨機(jī)性和不可克隆性的密鑰。該文通過(guò)對(duì)共源共柵電流鏡的研究,提出一種基于電流鏡工藝偏差的多端口可配置PUF電路。該P(yáng)UF電路由輸入寄存器、偏差電壓源、復(fù)用網(wǎng)絡(luò)、判決器陣列和擾亂模塊構(gòu)成,通過(guò)激勵(lì)信號(hào)配置偏差電壓源,無(wú)需更換硬件便可實(shí)現(xiàn)輸出密鑰的變化,且可在一個(gè)時(shí)鐘周期內(nèi)輸出多位密鑰。在SMIC 65 nm CMOS工藝下,采用全定制方式設(shè)計(jì)具有36個(gè)輸出端口的PUF電路,版圖面積為24.8 m77.4 m。實(shí)驗(yàn)結(jié)果表明,該P(yáng)UF電路具有良好的唯一性和隨機(jī)性,且工作在不同溫度(-40~125C)和電壓(1.08~1.32 V)下的可靠性均大于97.4%,可應(yīng)用于信息安全領(lǐng)域。
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出版歷程
  • 收稿日期:  2015-08-24
  • 修回日期:  2016-01-20
  • 刊出日期:  2016-06-19

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