利用四探針原理的微波極化干涉儀
A MICROWAVE POLAR INTERFEROMETER USING FOUR-PROBE PRINCIPLE
-
摘要: 本文提出一種利用四探針原理的微波極化干涉儀。四探針系統(tǒng)由兩個T形波導分支和一個串連在其間的可調(diào)移相器替代。該干涉儀,特別適用于測量瞬變等離子體的參量,并具有同時顯示等離子體的傳輸,反射和帶極座標原點的極化特性的能力。在頻率10GHz和35GHz下,用日光燈作瞬態(tài)放電實驗的照片是清晰的。
-
關(guān)鍵詞:
Abstract: A microwave polar interferometer using four-probe principle is presented, in which four-probe system is replaced by two T-junction waveguides in series with a tunable phase shifter between them. The interferometer is specially suitable for measuring the parameters of plasma transient process, and has the capability of displaying transmission, reflection, and polar characteristic with the origin of its coordinates at the same time.The experimental photographs of a transient plasma in the daylight lamp are clear at frequencies of 10 GHz and 35GHz. -
M. A. Heald and C. B. Warto, Plasma Diagnostics with Microwaves, John Wiley Sonc Inc.,New York, London, Sydney, pp. 192-241.[2]湯世賢,微波測量,國防工業(yè)出版社,1981年,第277-279頁.[3]張兆鏜,劉岐山,胡義正,莊義元,成都電訊工程學院學報,1984年, 第34期,第42-50頁. -
計量
- 文章訪問數(shù): 1876
- HTML全文瀏覽量: 150
- PDF下載量: 405
- 被引次數(shù): 0
下載:
