LB單分子膜中電荷密度的確定
DETERMINATION OF CHARGE DENSITY IN LB MONOFILM
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摘要: 本文介紹了一種新的測(cè)定單層LB膜中電荷密度的C-V方法,解決了常規(guī)C-V方法的不精確問(wèn)題。通過(guò)對(duì)硬脂酸C20H40O2膜中電荷密度的測(cè)定,表明此方法實(shí)用可行。
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關(guān)鍵詞:
- LB單分子膜; C-V方法; 電荷密度
Abstract: A modified C-V method for determination of charge density in LB mono-film is presented. The inaccuracy problem of the conventional C-V method is overcome entirely The method is proved to be applicable by determining the charge density in the monofilm. -
專集,日本科學(xué)與技術(shù),No. 2, (1987), pp. 1-76.[2]J. P. Lloyd et al., Thin Solid Films, 99(1983) 1, 297-304.[3]S. M. Sze, Physics of Semiconductor Devices. 2nd Ed. wdley, New York, (1981), pp. 362-379. -
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