|
H.J. Mamin, P. H. Guethner, D. Rugar D, Atomic emission from a scanning tunneling microscole tip, Phys. Rev. Lett., 1990, 65(19), 2418-2421.[2]G.S. Hsiao, R. M. Penner, J. Kingsley, Deposition of metal structures onto Si(111) surface by field evaporation in the scanning tunneling microscope, Appl. Phys. Lett., 1994, 64(11), 1350 1352.[3]C.S. Chang, W. B. Su, T. T. Tsong, Field evaporation between a gold tip and a surface in the scanning tunneling microscope configuration, Phys. Rev. Lett., 1994, 72(4), 574-577.[4]F. Grey, D. H. Huang, A. K. Koayashi, E. J. Snyder, Time-resolved atomic scale modification of silicon with a scanning tunneling microscope, J. Vac. Sci. Technol. B, 1994, 12(3), 1901-1905.[5]李志揚(yáng),劉武,黃光明,李興教,大氣環(huán)境下STM金針尖場(chǎng)蒸發(fā)納米書(shū)寫(xiě)實(shí)驗(yàn)研究,電子顯微學(xué)報(bào),1997,16(6),787-788.[6]李志揚(yáng),劉武,李興教,壓電陶瓷掃描管在納米加工中的應(yīng)用,壓電與聲光,1998,20(1),25-27[7]T.T. Tsong, Effect of an electric field in atomic manipulation, Phys. Rev. B, 1991, 44(10)13703-13710.[8]Zhiyang Li, Wu Liu, Xingjiao Li, Field evaporation in the configuration of a scanning tunneling microscope, Ultramicrosocpy, 1998, 73(1), 147-155.[9]Zhiyang Li, Wu Liu, Xingjiao Li, An electrothermodynamic analysis of field evaporation in the configuration of a scanning tunneling microscope, Chinese Physics Letters, 1998, 15(8), 608 610.[10]Gollisch, Surf. Sci. 1986, 166(1), 87-96.
|
下載:
