線性電路K故障診斷法的有效范圍
THE EFFECTIVE RANGE OF K-FAULT DIAGNOSIS OF LINEAR CIRCUIT
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摘要: 在使用K故障診斷法時(shí),為提高電路的可診斷性,可以采取諸如增加可及節(jié)點(diǎn),或改變激勵(lì)點(diǎn),增加激勵(lì)和測(cè)量次數(shù)等辦法。本文對(duì)這些措施的有效性,以及如何增加可及節(jié)點(diǎn)問題進(jìn)行了詳細(xì)的討論,特別著重對(duì)比較有效的多激勵(lì)法進(jìn)行研究,給出了用多激勵(lì)法進(jìn)行診斷時(shí),電路可K故障支路診斷的條件。
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關(guān)鍵詞:
- 模擬電路; 故障診斷; K故障診斷法
Abstract: In view of K-fault testability, the topological construction of a practical circuif is far from ideal. In order to improve the testability of a circuit, it is used to increase the number of accessible nodes or to use multi-excitation method. Effectiveness of these methods and feasibility choosing accessible nodes arc discussed in detail. The conditions for multi-excitation testability are presented. -
Zheng F. Huang, Cheng-Shang Lin, Ruey-Wen Liu, IEEE Trans. on CAS, CAS-30(1983), 257-265.[2]鄒銳,模擬電路K故障診斷,華中工學(xué)院學(xué)報(bào),1985年,第2期,第1-8頁.[3]蔣本璐,范麗娟,具有不可及節(jié)點(diǎn)的模擬電路的多故障診斷,1984年中國(guó)電子學(xué)會(huì)電路與系統(tǒng)第五屆年會(huì)論文集,西安,1985,第299-303頁. -
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