通道電子倍增器穩(wěn)定性的研究
STUDY ON THE STABILITY OF CHANNEL ELECTRON MULTIPLIERS
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摘要: 本文介紹了進(jìn)行高鉛玻璃通道電子倍增器(CEM)穩(wěn)定性試驗(yàn)的方法與結(jié)果,得到了總累計(jì)計(jì)數(shù)約1011的壽命數(shù)據(jù)。用俄歇電子能譜儀分析了疲勞的CEM的活性表面結(jié)構(gòu)與成份,發(fā)現(xiàn)了壽命試驗(yàn)過程中活性表面上碳的增加是CEM增益下降的主要原因,碳層的厚度約為50左右。為了提高CEM的耐烘烤性能,我們還研究了烘烤溫度對(duì)增益和分辨率的影響,以及烘烤溫度與還原溫度的某些關(guān)系,發(fā)現(xiàn)在保持一定電阻率的條件下,還原溫度越高,CEM的耐烘烤溫度也越高。
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關(guān)鍵詞:
Abstract: A method to test the stability of high lead glass CEM is made and some results are obtained. The life test datum with an accumulative count about 1011 is obtained; The stru-cture and composition of active surface of fatigued CEM are analyzed by using AES. We find the increase of carbon on the active surface is the main cause for the decrease of the CEM gain through the life test. The thicknese of contaminating carbon layer is approximately 50. In order to improve CEM s bake-resisting property, we have also studied theeffects of the baking temperature on the gain and FWHM, and the relationhip between the baking temperature and the reduction temperature. we find, on condition of keeping the resistivity constant at a certain time, the higber the reduction temperature, the higher the bake-resisting temperature is. -
Б.Н.Брагин,А.Е.Меламид,Итоги Иауки и Техники , 11(1979),102.[2]B. D. Klettke, N. D. Krym and W. G. Wolber, IEEE Trans. on NS, NS-17(1970), 72.[3]Y. Sakai, Surface Science, 86(1979), 359. -
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